|Title:||Measurements of thermal conductivity of thin films on substrates using photothermal deflection spectroscopy|
|Subject:||Thin films -- Thermal properties|
Diamond thin films -- Thermal properties
Hong Kong Polytechnic University -- Dissertations
Dept. of Applied Physics
|Pages:||v, 73 leaves : ill. ; 31 cm|
|Abstract:||The measurement of the thermal diffusivity is aimed at investigating the dynamic thermal behavior of materials. Different experimental schemes have been prepared for the measurements. Among these methods, photothermal deflection spectroscopy (PDS) has become popular during the last twenty years as they are non-destructive with no contact between the sample and the detector. However, precise alignment is required for the sensitivity of this method is very high. In this work we use transverse PDS techniques to study the thermal properties of various kinds of thin films on substrates and free standing diamond films. A brief review of the theory of PDS and the basic principles underlying the technique are given. The photothermal deflection of a probe beam associated with three different experimental configurations have been studied. They are the crossing method, phase detection method, and varying z0 method. The experimental techniques for both bouncing and skimming configurations are discussed. Experimental measurements were carried out for three series of samples. They are (i) boron-silicon films on Corning 7059 glass, (ii) free standing diamond films, and (iii) boron films on Corning 7059 glass. The results of the growing side of CVD diamond films as well as the side detached to the substrate are presented.|
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