A study of holographic and electronic speckle pattern interferometry methods of nondestructive testing on PZT components

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A study of holographic and electronic speckle pattern interferometry methods of nondestructive testing on PZT components

 

Author: Cheng, Wing-yin
Title: A study of holographic and electronic speckle pattern interferometry methods of nondestructive testing on PZT components
Degree: M.Sc.
Year: 1999
Subject: Holographic interferometry
Speckle metrology
Non-destructive testing
Composite materials
Quality control -- Optical methods
Engineering inspection
Hong Kong Polytechnic University -- Dissertations
Department: Multi-disciplinary Studies
Dept. of Applied Physics
Pages: ii, 78 leaves : ill. ; 30 cm
Language: English
InnoPac Record: http://library.polyu.edu.hk/record=b1483469
URI: http://theses.lib.polyu.edu.hk/handle/200/1825
Abstract: The use of optical the interferometry techniques as a non-destructive test (NDT) to investigate to improve the factory production process was investigated. Holographic interferometry and electronic speckle pattern interferometry (ESPI) have been used to measure the displacement of PZT buzzer under variable voltages. The background theories for holographic interferometry and ESPI were outlined and the experimental details of the methods, including the in-plane and out-of-plane ESPI setup, were presented. ESPI and holographic fringes on the buzzer were recorded on a CCD camera and the photograph film respectively. Comparison between holographic and ESPI results were made and possible reasons for the smaller values obtained using ESPI were proposed. A critical comparison of the two techniques showed that holography has the advantage of enabling study in a single stage due to its high quality fringes. The limitation of ESPI is due to its poor fringe definition. However, ESPI has advantages over holography interferometry because it is easier to handle and capable of real-time measurement.

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