| Author: | Cheng, Wing-yin |
| Title: | A study of holographic and electronic speckle pattern interferometry methods of nondestructive testing on PZT components |
| Degree: | M.Sc. |
| Year: | 1999 |
| Subject: | Holographic interferometry Speckle metrology Non-destructive testing Composite materials Quality control -- Optical methods Engineering inspection Hong Kong Polytechnic University -- Dissertations |
| Department: | Multi-disciplinary Studies Department of Applied Physics |
| Pages: | ii, 78 leaves : ill. ; 30 cm |
| Language: | English |
| Abstract: | The use of optical the interferometry techniques as a non-destructive test (NDT) to investigate to improve the factory production process was investigated. Holographic interferometry and electronic speckle pattern interferometry (ESPI) have been used to measure the displacement of PZT buzzer under variable voltages. The background theories for holographic interferometry and ESPI were outlined and the experimental details of the methods, including the in-plane and out-of-plane ESPI setup, were presented. ESPI and holographic fringes on the buzzer were recorded on a CCD camera and the photograph film respectively. Comparison between holographic and ESPI results were made and possible reasons for the smaller values obtained using ESPI were proposed. A critical comparison of the two techniques showed that holography has the advantage of enabling study in a single stage due to its high quality fringes. The limitation of ESPI is due to its poor fringe definition. However, ESPI has advantages over holography interferometry because it is easier to handle and capable of real-time measurement. |
| Rights: | All rights reserved |
| Access: | restricted access |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| b14834698.pdf | For All Users (off-campus access for PolyU Staff & Students only) | 2.83 MB | Adobe PDF | View/Open |
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