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dc.contributorFaculty of Engineeringen_US
dc.creatorZhang, Tingjie-
dc.identifier.urihttps://theses.lib.polyu.edu.hk/handle/200/5966-
dc.languageEnglishen_US
dc.publisherHong Kong Polytechnic University-
dc.rightsAll rights reserveden_US
dc.titleCharacterization of CZTS-based solar cell using 1/f noise and capacitance measurementsen_US
dcterms.abstractInvestigations of Cu₂ZnSnS₄-based (CZTS) solar cells have been performed. The configuration of the solar cell sample is In/CZTS/n-GaN, in which sapphire is used as the substrate. 1/f noise (10-100 kHz) is investigated for the CZTS solar cells through spectral characterization. I-V measurement was performed to choose the proper method of measuring low frequency noise. A model, in which the carriers are trapped and detrapped by the localized states via thermal activation processes, is used to interpret the experimental data of low frequency noise. To estimate the concentration of impurities in CZTS solar cell, the sample was characterized using C-V measurements.en_US
dcterms.extentvii, 65 leaves : ill. ; 30 cm.en_US
dcterms.isPartOfPolyU Electronic Thesesen_US
dcterms.issued2011en_US
dcterms.educationalLevelAll Masteren_US
dcterms.educationalLevelM.Sc.en_US
dcterms.LCSHHong Kong Polytechnic University -- Dissertationsen_US
dcterms.LCSHSolar cellsen_US
dcterms.accessRightsrestricted accessen_US

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