Author: Ko, Koon-yuen
Title: Built-in self test for analog circuits by oscillation-test method
Degree: M.Sc.
Year: 1999
Subject: Linear integrated circuits -- Testing
Hong Kong Polytechnic University -- Dissertations
Department: Multi-disciplinary Studies
Department of Electronic Engineering
Pages: ix, 100 leaves : ill. ; 30 cm
Language: English
Abstract: Although analog faults constitute 80% of the observed faults of mixed analog-digital VLSI circuits, testing techniques for analog circuits are still in a relatively slow pace when compare with those for digital circuits. Testing techniques for analog circuits based on oscillation-test method have been proposed by many researchers but there is not a general algorithm that can be applied to most of the analog circuits. This project is intended to derive and verify a general Built-In Self Test (BIST) algorithm based on oscillation-test method that can be applied to most of the analog circuits which consist of operational amplifier(s) (op amp(s)). For circuits with op amp(s), efficient test procedure and higher fault coverage will be obtained if the op amp(s) is/are proved fault-free. In this project, simple square wave and sinusoidal oscillators composed of op amps are used to investigate the fault coverage with respect to the oscillation frequencies and the output waveforms of this test algorithm. Based on simulation results, high fault coverage is achieved and the fault coverage and capability of fault location identification of this test algorithm can be enhanced by employing multiple oscillation frequencies. In order to make the oscillation frequency tunable, the feasibility of replacing the tuning elements, resistors and capacitors, with MOS capacitors and voltage-controlled linear MOS resistors are studied. Another approach, using schmitt trigger and constant current sources, that can also be used to control the oscillation frequency is also proposed and investigated in this project. Finally, an active low pass filter, consists of three op amps, equipped with this BIST algorithm is used to investigate and illustrate the different aspects including applicability, effectiveness, efficiency, and chip area overhead of the oscillation-test method. The active low pass filter, by using NMOS transistors as toggle switches, is reconfigured into two operation modes: Normal and Test. Under Normal mode, the active low pass filter performs its normal functions. Under Test mode, the op amps are separated from the rest of the circuitry and converted to an oscillator of three different configurations, namely Discrete, Serial, and Ring. The performance of these three configurations with respect to fault coverage, capability of locating the faults, and number of extra components required are then evaluated by observing their output oscillation frequencies and/or output amplitudes.
Rights: All rights reserved
Access: restricted access

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