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DC FieldValueLanguage
dc.contributorMulti-disciplinary Studiesen_US
dc.contributorDepartment of Manufacturing Engineeringen_US
dc.creatorYu, Tsz-kit-
dc.identifier.urihttps://theses.lib.polyu.edu.hk/handle/200/2758-
dc.languageEnglishen_US
dc.publisherHong Kong Polytechnic University-
dc.rightsAll rights reserveden_US
dc.titleApplication of design of experiment and virtual experiment to leadframe downset problemen_US
dcterms.abstractThis project demonstrates the approach on how to use finite element to do virtual experiment together with design of experiments (DOE). The proposed approach is demonstrated through a particular problem. In this study, downset problem of 64L QFP leadframe is chosen to illustrate the approach. A pilot simulation of a fictitious leadframe is done to testify the capability of the FEA software to model downset. Then pilot study on modeling 64L QFP downset is done and the simulation results are validated with experiment. The validated model is used as virtual prototype and full factorial design with 2 level is used in the experiment design. An empirical model is built from the virtual experiment downset results with curving fitting tool. The empirical model is describing the sensitivity of downset control parameters. And statistic testings on the effects of the control parameters were done. The results show that the effect of control parameter "die width compensation" is the least and not significant. All the control parameters: punch speed, punch depth compensation, die width compensation and type of pre-load spring have some degree of interaction with each other. An approximated model of the downset response is found. As there is a constant 30% difference between the simulated downset. value and the experimental downset value. The model can be adjusted to estimate the experimental downset depth value. To conclude, an application of design of experiments using virtual experiment technique to a particular leadfame downset is illustrated. The final results are encouraging because more detail answer is obtained compared with the present trial and error approach.en_US
dcterms.extenti, 5, 131 leaves : ill. (some col.) ; 30 cmen_US
dcterms.isPartOfPolyU Electronic Thesesen_US
dcterms.issued2001en_US
dcterms.educationalLevelAll Masteren_US
dcterms.educationalLevelM.Sc.en_US
dcterms.LCSHIntegrated circuits -- Design and constructionen_US
dcterms.LCSHFinite element methoden_US
dcterms.LCSHHong Kong Polytechnic University -- Dissertationsen_US
dcterms.accessRightsrestricted accessen_US

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Please use this identifier to cite or link to this item: https://theses.lib.polyu.edu.hk/handle/200/2758