|Title:||Single particle Monte Carlo simulation of carrier motion in semiconductor|
Monte Carlo method
Hong Kong Polytechnic University -- Dissertations
Department of Applied Physics
|Pages:||ii, 1, 35,  leaves : ill. ; 30 cm|
|Abstract:||This work intends to simulate the transport of an electron in semiconductor using Monte Carlo Method. The Monte Carlo Method is a probabilistic approach bases on sampling of random numbers. This method was first used in the modeling of semiconductors in 1960's. Later on, it has been applied to a wide variety of semiconductor problems including energy distribution, valley population, electron velocity and energy, etc. With this Single Particle Monte Carlo Simulation method, the transport process is simulated by one electron at microscopic level according to the semi - classical picture of carrier transport. The motion of carrier is treated as a sequence of free flights in the electric fields followed by scattering events ( collisions ). The drift time, the type of scattering processes, and the final state are random quantities. However, the free flight is a deterministic process and determined by the initial conditions and electric field strength. The above scattering processes are repeated until the simulation is sufficiently long for steady state phenomena. It was found that at low electric field, the mobility of the electron is increasing. On the other, at high electric field the mobility decreases, and the drift velocity is finally saturated. This simulation result qualitatively agree with experiments in Gallium Arsenide.|
Files in This Item:
|b15406660.pdf||For All Users (off-campus access for PolyU Staff & Students only)||1.84 MB||Adobe PDF||View/Open|
As a bona fide Library user, I declare that:
- I will abide by the rules and legal ordinances governing copyright regarding the use of the Database.
- I will use the Database for the purpose of my research or private study only and not for circulation or further reproduction or any other purpose.
- I agree to indemnify and hold the University harmless from and against any loss, damage, cost, liability or expenses arising from copyright infringement or unauthorized usage.
By downloading any item(s) listed above, you acknowledge that you have read and understood the copyright undertaking as stated above, and agree to be bound by all of its terms.
Please use this identifier to cite or link to this item: