|Title:||A study of the influence of different structures on resistivity of conductive knitted fabrics|
|Advisors:||Li, Li (ITC)|
Hu, Hong (ITC)
Au, Raymond Wai Man (ITC)
|Subject:||Textile fabrics -- Testing.|
Electronic textiles -- Testing.
Hong Kong Polytechnic University -- Dissertations
|Department:||Institute of Textiles and Clothing|
|Pages:||xxi, 172 pages : color illustrations|
|Abstract:||The research progress made in the field of materials science and the efforts put forth by many researchers have resulted in many research works that focus on wearable electronic textiles. Nowadays, wearable electronic textiles have progressed from the research lab into the industry and subsequently commercialized. The different ways of incorporating conductive fibers and electronic components into traditional textiles have been receiving much attention due to the potentially significant commercial value. However, the industry does not appear to have the means to new knowledge and knowledge transfer. For example, the industry does not have the resources to calculate and control yarn resistance on fabrics simply based on current textile knowledge, and wearable electronic products thus cannot be further developed. Nevertheless, the results of research on such products are not significant or adequate due to the complexity of the interdisciplinary efforts required for their success. Therefore, there is a need to establish a systematic method to provide the industry with a reference source to produce wearable electronics. The relationship between different stitches and the properties of conductive materials needs to be elaborated.|
This study conducts a series of experiments on the resistivity of conductive knitted fabric with different knitwear structures. Based on a previous study that modeled the resistance of plain jersey fabric with different numbers of wales and courses, planar geometric models are established for 1 x n float and Single Pique structures. Resistive network models are developed for different external voltages to determine the resistance values of conductive knitted fabrics with different numbers of wales and courses. Corresponding experiments are carried out to verify the proposed models. The simulated results obtained through modeling agree well with the experimental data with an acceptable range of error. Finally, a comparison of jersey (knit), float and tuck stitches is carried out with the relative wales and courses. It is concluded that both float and tuck stitches could reduce the total resistance of conductive knitted fabrics, and between them, tuck structures can provide lower resistance as well as a more aesthetically pleasing appearance. On the other hand, float structures are more economical, as conductive yarn is expensive so its cost is reduced with use of float stitch as the loop length is much shorter than that of the tuck stitches. Three thermal knitwear garments are developed in the experiments to test the thermal performance to determine the optimal design from the different knitted structures. It is concluded that the thermal properties are influenced by the different knitted structures and Single Pique has the most optimal performance in terms of the heating effect among the three types of selected structures. The newly developed resistance models in this study will provide significant benefits to the commercialization of wearable electronic textiles, as well as to the apparel industry as they can now offer apparel products that are not only aesthetically pleasing and multi-functional, but also have high added value.
|Rights:||All rights reserved|
Files in This Item:
|b29616797.pdf||For All Users||10.15 MB||Adobe PDF||View/Open|
As a bona fide Library user, I declare that:
- I will abide by the rules and legal ordinances governing copyright regarding the use of the Database.
- I will use the Database for the purpose of my research or private study only and not for circulation or further reproduction or any other purpose.
- I agree to indemnify and hold the University harmless from and against any loss, damage, cost, liability or expenses arising from copyright infringement or unauthorized usage.
By downloading any item(s) listed above, you acknowledge that you have read and understood the copyright undertaking as stated above, and agree to be bound by all of its terms.
Please use this identifier to cite or link to this item: